Reliability and engineering sciences area. Materials research: Single junction thin film

By NON

Book Id: WPLBN0002206953
Format Type: PDF eBook:
File Size: 2.23 MB
Reproduction Date: 2012

Title:	Reliability and engineering sciences area. Materials research: Single junction thin film
Author:	NON
Volume:
Language:	English
Subject:	DATA ACQUISITION, CHIPS (ELECTRONICS), OPTICAL COMMUNICATION
Collections:	Space and Aviation eDocuments Collection, NASA Publication Collection
Historic Publication Date:	1986
Publisher:


Citation APA MLA Chicago Non, B. (1986). Reliability and engineering sciences area. Materials research: Single junction thin film. Retrieved from https://self.gutenberg.org/

Description
Supplemental catalog subcollection information: NASA Publication Collection; Astrophysics and Technical Documents; A test bench was designed and fabricated for the purpose of improving control of hot-spot test accuracy. Electrochemical corrosion research

Summary
Contributor: National Aeronautics and Space Administration (NASA). The digitalization of this book was sponsored by National Aeronautics and Space Administration (NASA); Additional Subject Descriptions: DATA ACQUISITION; CHIPS (ELECTRONICS); OPTICAL COMMUNICATION; KALMAN FILTERS; HALLEY'S COMET; HOLOGRAPHY; PHOTOGRAMMETRY; RADIO INTERFEROMETERS; SIGNAL TO NOISE RATIOS; SUPERHIGH FREQUENCIES; TRAVELING WAVE MASERS; DEEP SPACE NETWORK; VERY LARGE SCALE INTEGRATION; GEODYNAMICS